:html_theme.sidebar_secondary.remove: true .. _bibliography: Bibliography ============ .. _[Burdet2013]: :ref:`[Burdet2013] <[Burdet2013]>` P. Burdet, J. Vannod, A. Hessler-Wyser, M. Rappaz, and M. Cantoni, "Three-dimensional chemical analysis of laser-welded NiTi–stainless steel wires using a dual-beam FIB," *Acta Materialia* 61 (2013): 3090–3098 [``_]. .. _Candes2011: :ref:`[Candes2011] ` E. Candes, X. Li, Y. Ma and J. Wright, "Robust principal component analysis?" *J. ACM* 58(3) (2011): 1–37 [``_]. .. _Egerton2011: :ref:`[Egerton2011] ` R. Egerton, "Electron Energy-Loss Spectroscopy in the Electron Microscope," Springer-Verlag, 2011 [``_]. .. _Feng2013: :ref:`[Feng2013] ` J. Feng, H. Xu and S. Yan, "Online Robust PCA via Stochastic Optimization," *NIPS 2013*, 2013 [``_]. .. _Herraez: :ref:`[Herraez] ` M. Herráez, D. Burton, M. Lalor, and M. Gdeisat, "Fast two-dimensional phase-unwrapping algorithm based on sorting by reliability following a noncontinuous path," *Applied Optics*, 41(35) (2002): 7437-7444 [``_]. .. _Hyvarinen2000: :ref:`[Hyvarinen2000] ` A. Hyvarinen and E. Oja, "Independent component analysis: algorithms and applications," *Neural Networks* 13 (2000): 411–430 [``_]. .. _Keenan2004: :ref:`[Keenan2004] ` M. Keenan and P. Kotula, "Accounting for Poisson noise in the multivariate analysis of ToF-SIMS spectrum images," *Surf. Interface Anal* 36(3) (2004): 203–212 [``_]. .. _[Nicoletti2013]: :ref:`[Nicoletti2013] <[Nicoletti2013]>` O. Nicoletti, F. de la Peña, R. Leary, D. Holland, C. Ducati, and P. Midgley, "Three-dimensional imaging of localized surface plasmon resonances of metal nanoparticles," *Nature* 502 (2013): 80-84 [``_]. .. _Pena2010: :ref:`[Pena2010] ` F. de la Peña, M.-H. Berger, J.-F. Hochepid, F. Dynys, O. Stephan, and M. Walls, "Mapping titanium and tin oxide phases using EELS: An application of independent component analysis," *Ultramicroscopy* 111 (2010): 169–176 [``_]. .. _Zhao2016: :ref:`[Zhao2016] ` R. Zhao and V. Tan, "Online nonnegative matrix factorization with outliers." *2016 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)*, IEEE, 2016 [``_, ``_]. .. _Zhou2011: :ref:`[Zhou2011] ` T. Zhou and D. Tao, "GoDec: Randomized Low-rank & Sparse Matrix Decomposition in Noisy Case", *ICML-11* (2011): 33–40 [``_]. .. _Schaffer2004: :ref:`[Schaffer2004] ` Bernhard Schaffer, Werner Grogger and Gerald Kothleitner. “Automated Spatial Drift Correction for EFTEM Image Series.” Ultramicroscopy 102, no. 1 (December 2004): 27–36 [``_]. .. _Guizar2008: :ref:`[Guizar2008] ` Manuel Guizar-Sicairos, Samuel T. Thurman, and James R. Fienup, “Efficient subpixel image registration algorithms", Optics Letters 33, 156-158 (2008). DOI:10.1364/OL.33.000156 [``_]. .. _Satopää2011: :ref:`[Satopää2011] ` Ville Satopää, Jeannie Albrecht, David Irwin, Barath Raghavan. "Finding a "Kneedle" in a Haystack: Detecting Knee Points in System Behavior. 31st International Conference on Distributed Computing Systems Workshops", pp. 166-171, Minneapolis, Minnesota, USA, June 2011 [``_]. .. _Lerotic2004: :ref:`[Lerotic2004] ` M Lerotic, C Jacobsen, T Schafer, S Vogt "Cluster analysis of soft X-ray spectromicroscopy data". Ultramicroscopy 100 (2004) 35–57 [``_] .. _Iakoubovskii2008: :ref:`[Iakoubovskii2008] ` Iakoubovskii, K., K. Mitsuishi, Y. Nakayama, and K. Furuya. ‘Thickness Measurements with Electron Energy Loss Spectroscopy’. Microscopy Research and Technique 71, no. 8 (2008): 626–31. [``_]. .. _Rossouw2015: :ref:`[Rossouw2015] ` D. Rossouw, P. Burdet, F. de la Peña, C. Ducati, B. Knappett, A. Wheatley, and P. Midgley, "Multicomponent Signal Unmixing from Nanoheterostructures: Overcoming the Traditional Challenges of Nanoscale X-ray Analysis via Machine Learning," *Nano Lett.* 15(4) (2015): 2716–2720 [``_]. .. _White2009: :ref:`[White2009] ` T.A. White, “Structure solution using precession electron diffraction and diffraction tomography” PhD Thesis, University of Cambridge, 2009. .. _Zaefferer2000: :ref:`[Zaefferer2000] ` S. Zaefferer, “New developments of computer-aided crystallographic analysis in transmission electron microscopy” J. Appl. Crystallogr., vol. 33, no. v, pp. 10–25, 2000. [``_].