Bibliography

[Burdet2013]

P. Burdet, J. Vannod, A. Hessler-Wyser, M. Rappaz, and M. Cantoni, “Three-dimensional chemical analysis of laser-welded NiTi–stainless steel wires using a dual-beam FIB,” Acta Materialia 61 (2013): 3090–3098 [https://doi.org/10.1016/j.actamat.2013.01.069].

[Chantler2005]

Chantler, C.T., Olsen, K., Dragoset, R.A., Kishore, A.R., Kotochigova, S.A., and Zucker, D.S. (2005), X-Ray Form Factor, Attenuation and Scattering Tables (version 2.1). https://dx.doi.org/10.18434/T4HS32.

[Egerton2011]

R. Egerton, “Electron Energy-Loss Spectroscopy in the Electron Microscope,” Springer-Verlag, 2011 [https://doi.org/10.1007/978-1-4419-9583-4].

[MacArthur2016]

K. MacArthur, T. Slater, S. Haigh, D. Ozkaya, P. Nellist, and S. Lozano-Perez, “Quantitative Energy-Dispersive X-Ray Analysis of Catalyst Nanoparticles Using a Partial Cross Section Approach,” Microsc. Microanal. 22 (2016): 71–81 [https://doi.org/10.1017/S1431927615015494].

[Rossouw2015]

D. Rossouw, P. Burdet, F. de la Peña, C. Ducati, B. Knappett, A. Wheatley, and P. Midgley, “Multicomponent Signal Unmixing from Nanoheterostructures: Overcoming the Traditional Challenges of Nanoscale X-ray Analysis via Machine Learning,” Nano Lett. 15(4) (2015): 2716–2720 [https://doi.org/10.1021/acs.nanolett.5b00449].

[Watanabe1996]

M. Watanabe, Z. Horita, and M. Nemoto, “Absorption correction and thickness determination using the zeta factor in quantitative X-ray microanalysis,” Ultramicroscopy 65 (1996): 187–198 [https://doi.org/10.1016/S0304-3991(96)00070-8].

[Watanabe2006]

M. Watanabe and D. Williams, “The quantitative analysis of thin specimens: a review of progress from the Cliff-Lorimer to the new zeta-factor methods,” J. Microsc. 221 (2006): 89–109 [https://onlinelibrary.wiley.com/doi/10.1111/j.1365-2818.2006.01549.x].

[Williams2009]

D. Williams and B Carter, “Transmission Electron Microscopy: A Textbook for Materials Science (Part 4),” Second Ed., Springer, New York, 2009 [https://doi.org/10.1007/978-0-387-76501-3].