Bibliography

Bibliography

[Burdet2013]P. Burdet, J. Vannod, A. Hessler-Wyser, M. Rappaz, M. Cantoni, “Three-dimensional chemical analysis of laser-welded NiTi–stainless steel wires using a dual-beam FIB”, Acta Materialia 61 (2013) 3090–3098.
[Candes2011]E. Candes, X. Li, Y. Ma and J. Wright, “Robust principal component analysis?” J. ACM 58(3) (2011) 1–37
[Chantler2015]http://physics.nist.gov/ffast
[Egerton2011]Ray Egerton, “Electron Energy-Loss Spectroscopy in the Electron Microscope”, Springer-Verlag, 2011.
[Feng2013]J. Feng, H. Xu and S. Yan, “Online Robust PCA via Stochastic Optimization”, NIPS 2013, 2013.
[Hyvarinen2000]A. Hyvarinen, E. Oja, “Independent component analysis: algorithms and applications”, Neural Networks 13 (2000) 411–430.
[Keenan2004]Michael R. Keenan, Paul G. Kotula, “Accounting for Poisson noise in the multivariate analysis of ToF-SIMS spectrum images”, Surf. Interface Anal 36(3) (2004) 203–212.
[MacArthur2016]Katherine E. MacArthur, Thomas J. A. Slater, Sarah J. Haigh, Dogan Ozkaya, Peter D. Nellist, Sergio Lozano-Perez, “Quantitative Energy-Dispersive X-Ray Analysis of Catalyst Nanoparticles Using a Partial Cross Section Approach.” Microsc. Microanal. 22 (2016) 71–81. doi:10.1017/S1431927615015494.
[Pena2010]F. de la Pena, M.-H. Berger, J.-F. Hochepid, F. Dynys, O. Stephan, M. Walls, “Mapping titanium and tin oxide phases using EELS: An application of independent component analysis”, Ultramicroscopy 111 (2010) 169–176.
[Rossouw2015]David Rossouw, Pierre Burdet, Francisco de la Pena, Caterina Ducati, Benjamin R. Knappett, Andrew E. H. Wheatley, Paul A. Midgley, “Multicomponent Signal Unmixing from Nanoheterostructures: Overcoming the Traditional Challenges of Nanoscale X-ray Analysis via Machine Learning” Nano Lett. 15(4) (2015) 2716–2720
[Watanabe1996]Masashi Watanabe, Zenji Horita, Minoru Nemoto, “Absorption correction and thickness determination using the zeta factor in quantitative X-ray microanalysis.” Ultramicroscopy 65 (1996) 187–198.
[Watanabe2006]Masashi Watanabe, David B. Williams, “The quantitative analysis of thin specimens: a review of progress from the Cliff-Lorimer to the new zeta-factor methods. J. Microsc. 221 (2006) 89–109. doi:10.1111/j.1365-2818.2006.01549.x.
[Williams2009]David B. Williams, Barry Carter, “Transmission Electron Microscopy: A Textbook for Materials Science (Part 4)”, Second Edi, Springer, New York, 2009.
[Zhou2011]T. Zhou and D. Tao, “GoDec: Randomized Low-rank & Sparse Matrix Decomposition in Noisy Case”, ICML-11 (2011) 33–40.

Peer-review articles with results obtained using HyperSpy

Note

Given the incresing number of articles that cite HyperSpy we no longer update the list of articles below. For an up to date list search for HyperSpy in a scientific database e.g. Google Scholar.

Warning

The articles published before 2012 may mention the HyperSpy project under its old name, EELSLab

JabRef References output

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    AuthorTitleYearJournal/ProceedingsReftypeDOI/URL
    Arenal, R., de la Peña, F., Stephan, O., Walls, M., Tence, M., Loiseau, A. & Colliex, C. Extending the analysis of EELS spectrum-imaging data, from elemental to bond mapping in complex nanostructures

    [Abstract] [BibTeX]

    		 2008 Ultramicroscopy
    Vol. 109(1), pp. 32-38     		 article DOI URL 
    Abstract: Multiple least squares fitting has been employed for long time in elemental electron energy-loss spectroscopy (EELS) analysis, in particular in biology, but with the hypothesis of a rather stable shape for the used core-loss signals. In the present case, we explore its use for identifying the variations in the edges' fine structures in complex boron nitride samples and in particular for mapping the bonding types of boron in such samples. Details about this improved procedure applied to data acquired in the spectrum-imaging mode are reported here.
    BibTeX: 
    @article{arenal_extending_2008,
  author = {Arenal, R. and de la Peña, F. and Stephan, O. and Walls, M. and Tence, M. and Loiseau, A. and Colliex, C.},
  title = {Extending the analysis of EELS spectrum-imaging data, from elemental to bond mapping in complex nanostructures},
  journal = {Ultramicroscopy},
  year = {2008},
  volume = {109},
  number = {1},
  pages = {32--38},
  url = {http://www.sciencedirect.com/science/article/B6TW1-4T2S8W3-1/2/acb6eef10200d49c99310f24108313b7},
  doi = {http://dx.doi.org/10.1016/j.ultramic.2008.07.005}
}
    Cooper, D., de la Peña, F., Béché, A., Rouvière, Jean-Luc., Servanton, G., Pantel, R. & Morin, P. Field Mapping with Nanometer-Scale Resolution for the Next Generation of Electronic Devices

    [BibTeX]

    		 2011 Nano Letters, pp. 111013111159007  article DOI URL 
    BibTeX: 
    @article{cooper_field_2011,
  author = {Cooper, David and de la Peña, Francisco and Béché, Armand and Rouvière, Jean-Luc and Servanton, Germain and Pantel, Roland and Morin, Pierre},
  title = {Field Mapping with Nanometer-Scale Resolution for the Next Generation of Electronic Devices},
  journal = {Nano Letters},
  year = {2011},
  pages = {111013111159007},
  url = {http://pubs.acs.org/doi/abs/10.1021/nl201813w},
  doi = {http://dx.doi.org/10.1021/nl201813w}
}
    Estrade, S., Arbiol, J., Peiro, F., Infante, I.C., Sanchez, F., Fontcuberta, J., de la Peña, F., Walls, M. & Colliex, C. Cationic and charge segregation in La[sub 2/3]Ca[sub 1/3]MnO[sub 3] thin films grown on (001) and (110) SrTiO[sub 3]

    [BibTeX]

    		 2008 Applied Physics Letters
    Vol. 93(11), pp. 112505-3     		 article DOI URL 
    BibTeX: 
    @article{estrade_cationic_2008,
  author = {Estrade, S. and Arbiol, J. and Peiro, F. and Infante, I. C. and Sanchez, F. and Fontcuberta, J. and de la Peña, F. and Walls, M. and Colliex, C.},
  title = {Cationic and charge segregation in La[sub 2/3]Ca[sub 1/3]MnO[sub 3] thin films grown on (001) and (110) SrTiO[sub 3]},
  journal = {Applied Physics Letters},
  year = {2008},
  volume = {93},
  number = {11},
  pages = {112505--3},
  url = {http://link.aip.org/link/?APL/93/112505/1},
  doi = {http://dx.doi.org/10.1063/1.2981574}
}
    de la Peña, F., Barrett, N., Zagonel, L.F.., Walls, M. & Renault, O. Full field chemical imaging of buried native sub-oxide layers on doped silicon patterns

    [Abstract] [BibTeX]

    		 2010 Surface Science
    Vol. 604(19-20), pp. 1628-1636     		 article DOI URL 
    Abstract: Fully energy-filtered X-ray photoelectron emission microscopy is used to analyze the spatial distribution of the silicon sub-oxide structure at the SiO2/Si interface as a function of underlying doping pattern. Using a spectroscopic pixel-by-pixel curve fitting analysis, we obtain the sub-oxide binding energy and intensity distributions over the full field of view. Binding energy maps for each oxidation state are obtained with a spatial resolution of 120 nm. Within the framework of a five-layer model, the experimental data are used to obtain quantitative maps of the sub-oxide layer thickness and also their spatial distribution over the p-n junctions. Variations in the sub-oxide thicknesses are found to be linked to the level and type of doping. The procedure, which takes into account instrumental artefacts, enables the quantitative analysis of the full 3D dataset.
    BibTeX: 
    @article{de_la_pena_full_2010,
  author = {de la Peña, F. and Barrett, N. and Zagonel, L.F. and Walls, M. and Renault, O.},
  title = {Full field chemical imaging of buried native sub-oxide layers on doped silicon patterns},
  journal = {Surface Science},
  year = {2010},
  volume = {604},
  number = {19-20},
  pages = {1628--1636},
  url = {http://www.sciencedirect.com/science/article/B6TVX-509XPNT-3/2/aa36bb3b2b7d94cee13ee35b9d1c39d1},
  doi = {http://dx.doi.org/10.1016/j.susc.2010.06.006}
}
    de la Peña, F., Berger, M.-H.., Hochepied, J.-F.., Dynys, F., Stephan, O. & Walls, M. Mapping titanium and tin oxide phases using EELS: An application of independent component analysis

    [Abstract] [BibTeX]

    		 2011 Ultramicroscopy
    Vol. 111(2), pp. 169-176     		 article DOI URL 
    Abstract: We study materials that present challenges for conventional elemental mapping techniques and can in some cases be treated successfully using independent component analysis (ICA). In this case the material in question is obtained from a TiO2-SiO2 solid solution that is spinodally decomposed into TiO2 rich-SnO2 rich multilayers. Conventional elemental mapping is difficult because the edges most easily mapped for these elements (Ti-L, Sn-M and O-K) all have onsets within the same 80 eV range. ICA is used to separate entire spectral signals corresponding to particular material phases or molecular units rather than particular elements and is thus able to distinguish between TiO2 and SnO2. We show that quantification of oxide species can be performed by different methods that require extra assumptions, but nevertheless should be feasible in many cases.
    BibTeX: 
    @article{de_la_pena_mapping_2011,
  author = {de la Peña, F. and Berger, M.-H. and Hochepied, J.-F. and Dynys, F. and Stephan, O. and Walls, M.},
  title = {Mapping titanium and tin oxide phases using EELS: An application of independent component analysis},
  journal = {Ultramicroscopy},
  year = {2011},
  volume = {111},
  number = {2},
  pages = {169--176},
  url = {http://www.sciencedirect.com/science/article/pii/S030439911000255X},
  doi = {16/j.ultramic.2010.10.001}
}
    Sanchez, A.M., Beltran, A.M., Beanland, R., Ben, T., Gass, M.H., de la Peña, F., Walls, M., Taboada, A.G., Ripalda, J.M. & Molina, S.I. Blocking of indium incorporation by antimony in III–V-Sb nanostructures

    [BibTeX]

    		 2010 Nanotechnology
    Vol. 21(14), pp. 145606     		 article DOI URL 
    BibTeX: 
    @article{sanchez_blocking_2010,
  author = {Sanchez, A M and Beltran, A M and Beanland, R and Ben, T and Gass, M H and de la Peña, F and Walls, M and Taboada, A G and Ripalda, J M and Molina, S I},
  title = {Blocking of indium incorporation by antimony in III–V-Sb nanostructures},
  journal = {Nanotechnology},
  year = {2010},
  volume = {21},
  number = {14},
  pages = {145606},
  url = {http://iopscience.iop.org/0957-4484/21/14/145606/},
  doi = {http://dx.doi.org/10.1088/0957-4484/21/14/145606}
}
    Trasobares, S., López-Haro, M., Kociak, M., March, K., de La Peña, F., Perez-Omil, J.A., Calvino, J.J., Lugg, N.R., D'Alfonso, A.J., Allen, L.J. & Colliex, C. Chemical Imaging at Atomic Resolution as a Technique To Refine the Local Structure of Nanocrystals

    [BibTeX]

    		 2011 Angewandte Chemie International Edition, pp. n/a-n/a  article DOI URL 
    BibTeX: 
    @article{trasobares_chemical_2011,
  author = {Trasobares, Susana and López-Haro, Miguel and Kociak, Mathieu and March, Katia and de La Peña, Francisco and Perez-Omil, Jose A. and Calvino, Jose J. and Lugg, Nathan R. and D'Alfonso, Adrian J. and Allen, Leslie J. and Colliex, Christian},
  title = {Chemical Imaging at Atomic Resolution as a Technique To Refine the Local Structure of Nanocrystals},
  journal = {Angewandte Chemie International Edition},
  year = {2011},
  pages = {n/a--n/a},
  url = {http://onlinelibrary.wiley.com/doi/10.1002/anie.201004502/abstract},
  doi = {http://dx.doi.org/10.1002/anie.201004502}
}

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