P. Burdet, J. Vannod, A. Hessler-Wyser, M. Rappaz, and M. Cantoni, “Three-dimensional chemical analysis of laser-welded NiTi–stainless steel wires using a dual-beam FIB,” Acta Materialia 61 (2013): 3090–3098 [link].
E. Candes, X. Li, Y. Ma and J. Wright, “Robust principal component analysis?” J. ACM 58(3) (2011): 1–37 [link].
C. Chantler, K. Olsen, R. Dragoset, J. Chang, A. Kishore, S. Kotochigova, and D. Zucker, “Detailed Tabulation of Atomic Form Factors, Photoelectric Absorption and Scattering Cross Section, and Mass Attenuation Coefficients for Z = 1-92 from E = 1-10 eV to E = 0.4-1.0 MeV” NIST Standard Reference Data [link].
R. Egerton, “Electron Energy-Loss Spectroscopy in the Electron Microscope,” Springer-Verlag, 2011 [link].
J. Feng, H. Xu and S. Yan, “Online Robust PCA via Stochastic Optimization,” NIPS 2013, 2013 [link].
D. Gabor, “A new microscopic principle,” Nature 161 (1948): 777-778 [link].
M. Herráez, D. Burton, M. Lalor, and M. Gdeisat, “Fast two-dimensional phase-unwrapping algorithm based on sorting by reliability following a noncontinuous path,” Applied Optics, 41(35) (2002): 7437-7444 [link].
A. Hyvarinen and E. Oja, “Independent component analysis: algorithms and applications,” Neural Networks 13 (2000): 411–430 [link].
D.Joy, Y.-S. Zhang, X. Zhang, T.Hashimoto, R. Bunn, L.Allard, and T. Nolan, “Practical aspects of electron holography,” Ultramicroscopy 51.1-4 (1993): 1-14 [link].
M. Keenan and P. Kotula, “Accounting for Poisson noise in the multivariate analysis of ToF-SIMS spectrum images,” Surf. Interface Anal 36(3) (2004): 203–212 [link].
K. MacArthur, T. Slater, S. Haigh, D. Ozkaya, P. Nellist, and S. Lozano-Perez, “Quantitative Energy-Dispersive X-Ray Analysis of Catalyst Nanoparticles Using a Partial Cross Section Approach,” Microsc. Microanal. 22 (2016): 71–81 [link].
M. McCartney and D. Smith, “Electron holography: phase imaging with nanometer resolution,” Annu. Rev. Mater. Res. 37 (2007): 729-767 [link].
O. Nicoletti, F. de la Peña, R. Leary, D. Holland, C. Ducati, and P. Midgley, “Three-dimensional imaging of localized surface plasmon resonances of metal nanoparticles,” Nature 502 (2013): 80-84 [link].
F. de la Peña, M.-H. Berger, J.-F. Hochepid, F. Dynys, O. Stephan, and M. Walls, “Mapping titanium and tin oxide phases using EELS: An application of independent component analysis,” Ultramicroscopy 111 (2010): 169–176 [link].
D. Rossouw, P. Burdet, F. de la Peña, C. Ducati, B. Knappett, A. Wheatley, and P. Midgley, “Multicomponent Signal Unmixing from Nanoheterostructures: Overcoming the Traditional Challenges of Nanoscale X-ray Analysis via Machine Learning,” Nano Lett. 15(4) (2015): 2716–2720 [link].
A. Tonomura, “Electron Holography,” Springer Berlin Heidelberg, 1999. 78-132 [link].
M. Watanabe, Z. Horita, and M. Nemoto, “Absorption correction and thickness determination using the zeta factor in quantitative X-ray microanalysis,” Ultramicroscopy 65 (1996): 187–198 [link].
M. Watanabe and D. Williams, “The quantitative analysis of thin specimens: a review of progress from the Cliff-Lorimer to the new zeta-factor methods,” J. Microsc. 221 (2006): 89–109 [link].
D. Williams and B Carter, “Transmission Electron Microscopy: A Textbook for Materials Science (Part 4),” Second Ed., Springer, New York, 2009 [link].
R. Zhao and V. Tan, “Online nonnegative matrix factorization with outliers.” 2016 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP), IEEE, 2016 [link, arXiv].
T. Zhou and D. Tao, “GoDec: Randomized Low-rank & Sparse Matrix Decomposition in Noisy Case”, ICML-11 (2011): 33–40 [link].

Peer-review articles with results obtained using HyperSpy


Given the incresing number of articles that cite HyperSpy we no longer maintain a list of articles here. For an up to date list search for HyperSpy in a scientific database e.g. Google Scholar.


The articles published before 2012 may mention the HyperSpy project under its old name, EELSLab