Bibliography
Bibliography
- [Burdet2013]
P. Burdet, J. Vannod, A. Hessler-Wyser, M. Rappaz, and M. Cantoni, “Three-dimensional chemical analysis of laser-welded NiTi–stainless steel wires using a dual-beam FIB,” Acta Materialia 61 (2013): 3090–3098 [https://doi.org/10.1016/j.actamat.2013.01.069].
- [Candes2011]
E. Candes, X. Li, Y. Ma and J. Wright, “Robust principal component analysis?” J. ACM 58(3) (2011): 1–37 [https://arxiv.org/pdf/0912.3599.pdf].
- [Chantler2005]
C. Chantler, K. Olsen, R. Dragoset, J. Chang, A. Kishore, S. Kotochigova, and D. Zucker, “Detailed Tabulation of Atomic Form Factors, Photoelectric Absorption and Scattering Cross Section, and Mass Attenuation Coefficients for Z = 1-92 from E = 1-10 eV to E = 0.4-1.0 MeV” NIST Standard Reference Data [http://physics.nist.gov/ffast].
- [Egerton2011]
R. Egerton, “Electron Energy-Loss Spectroscopy in the Electron Microscope,” Springer-Verlag, 2011 [https://doi.org/10.1007/978-1-4419-9583-4].
- [Feng2013]
J. Feng, H. Xu and S. Yan, “Online Robust PCA via Stochastic Optimization,” NIPS 2013, 2013 [https://papers.nips.cc/paper/5131-online-robust-pca-via-stochastic-optimization].
- [Gabor1948]
D. Gabor, “A new microscopic principle,” Nature 161 (1948): 777-778 [https://doi.org/10.1038/161777a0].
- [Herraez]
M. Herráez, D. Burton, M. Lalor, and M. Gdeisat, “Fast two-dimensional phase-unwrapping algorithm based on sorting by reliability following a noncontinuous path,” Applied Optics, 41(35) (2002): 7437-7444 [https://doi.org/10.1364/AO.41.007437].
- [Hyvarinen2000]
A. Hyvarinen and E. Oja, “Independent component analysis: algorithms and applications,” Neural Networks 13 (2000): 411–430 [https://doi.org/10.1016/S0893-6080(00)00026-5].
- [Joy1993]
D.Joy, Y.-S. Zhang, X. Zhang, T.Hashimoto, R. Bunn, L.Allard, and T. Nolan, “Practical aspects of electron holography,” Ultramicroscopy 51.1-4 (1993): 1-14 [https://doi.org/10.1016/0304-3991(93)90130-P].
- [Keenan2004]
M. Keenan and P. Kotula, “Accounting for Poisson noise in the multivariate analysis of ToF-SIMS spectrum images,” Surf. Interface Anal 36(3) (2004): 203–212 [https://doi.org/10.1002/sia.1657].
- [MacArthur2016]
K. MacArthur, T. Slater, S. Haigh, D. Ozkaya, P. Nellist, and S. Lozano-Perez, “Quantitative Energy-Dispersive X-Ray Analysis of Catalyst Nanoparticles Using a Partial Cross Section Approach,” Microsc. Microanal. 22 (2016): 71–81 [https://doi.org/10.1017/S1431927615015494].
- [McCartney2007]
M. McCartney and D. Smith, “Electron holography: phase imaging with nanometer resolution,” Annu. Rev. Mater. Res. 37 (2007): 729-767 [https://doi.org/10.1146/annurev.matsci.37.052506.084219].
- [Nicoletti2013]
O. Nicoletti, F. de la Peña, R. Leary, D. Holland, C. Ducati, and P. Midgley, “Three-dimensional imaging of localized surface plasmon resonances of metal nanoparticles,” Nature 502 (2013): 80-84 [https://doi.org/10.1038/nature12469].
- [Pena2010]
F. de la Peña, M.-H. Berger, J.-F. Hochepid, F. Dynys, O. Stephan, and M. Walls, “Mapping titanium and tin oxide phases using EELS: An application of independent component analysis,” Ultramicroscopy 111 (2010): 169–176 [https://doi.org/10.1016/j.ultramic.2010.10.001].
- [Rossouw2015]
D. Rossouw, P. Burdet, F. de la Peña, C. Ducati, B. Knappett, A. Wheatley, and P. Midgley, “Multicomponent Signal Unmixing from Nanoheterostructures: Overcoming the Traditional Challenges of Nanoscale X-ray Analysis via Machine Learning,” Nano Lett. 15(4) (2015): 2716–2720 [https://doi.org/10.1021/acs.nanolett.5b00449].
- [Tonomura1999]
A. Tonomura, “Electron Holography,” Springer Berlin Heidelberg, 1999. 78-132 [https://doi.org/10.1007/978-3-540-37204-2].
- [Watanabe1996]
M. Watanabe, Z. Horita, and M. Nemoto, “Absorption correction and thickness determination using the zeta factor in quantitative X-ray microanalysis,” Ultramicroscopy 65 (1996): 187–198 [https://doi.org/10.1016/S0304-3991(96)00070-8].
- [Watanabe2006]
M. Watanabe and D. Williams, “The quantitative analysis of thin specimens: a review of progress from the Cliff-Lorimer to the new zeta-factor methods,” J. Microsc. 221 (2006): 89–109 [https://doi.org/10.1111/j.1365-2818.2006.01549.x].
- [Williams2009]
D. Williams and B Carter, “Transmission Electron Microscopy: A Textbook for Materials Science (Part 4),” Second Ed., Springer, New York, 2009 [https://doi.org/10.1007/978-0-387-76501-3].
- [Zhao2016]
R. Zhao and V. Tan, “Online nonnegative matrix factorization with outliers.” 2016 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP), IEEE, 2016 [https://doi.org/10.1109/TSP.2016.2620967, https://arxiv.org/pdf/1604.02634.pdf].
- [Zhou2011]
T. Zhou and D. Tao, “GoDec: Randomized Low-rank & Sparse Matrix Decomposition in Noisy Case”, ICML-11 (2011): 33–40 [http://www.icml-2011.org/papers/41_icmlpaper.pdf].
- [Schaffer2004]
Bernhard Schaffer, Werner Grogger and Gerald Kothleitner. “Automated Spatial Drift Correction for EFTEM Image Series.” Ultramicroscopy 102, no. 1 (December 2004): 27–36 [https://doi.org/10.1016/j.ultramic.2004.08.003].
- [Guizar2008]
Manuel Guizar-Sicairos, Samuel T. Thurman, and James R. Fienup, “Efficient subpixel image registration algorithms”, Optics Letters 33, 156-158 (2008). DOI:10.1364/OL.33.000156 [https://doi.org/10.1364/OL.33.000156].
- [Satopää2011]
Ville Satopää, Jeannie Albrecht, David Irwin, Barath Raghavan. “Finding a “Kneedle” in a Haystack: Detecting Knee Points in System Behavior. 31st International Conference on Distributed Computing Systems Workshops”, pp. 166-171, Minneapolis, Minnesota, USA, June 2011 [https://doi.org/10.1109/ICDCSW.2011.20].
- [Lerotic2004]
M Lerotic, C Jacobsen, T Schafer, S Vogt “Cluster analysis of soft X-ray spectromicroscopy data”. Ultramicroscopy 100 (2004) 35–57 [https://doi.org/10.1016/j.ultramic.2004.01.008]
- [Iakoubovskii2008]
Iakoubovskii, K., K. Mitsuishi, Y. Nakayama, and K. Furuya. ‘Thickness Measurements with Electron Energy Loss Spectroscopy’. Microscopy Research and Technique 71, no. 8 (2008): 626–31. [https://doi.org/10.1002/jemt.20597].
- [White2009]
T.A. White, “Structure solution using precession electron diffraction and diffraction tomography” PhD Thesis, University of Cambridge, 2009.
- [Zaefferer2000]
S. Zaefferer, “New developments of computer-aided crystallographic analysis in transmission electron microscopy” J. Appl. Crystallogr., vol. 33, no. v, pp. 10–25, 2000. [https://doi.org/10.1107/S0021889899010894].
Peer-review articles with results obtained using HyperSpy
Note
Given the incresing number of articles that cite HyperSpy we no longer maintain a list of articles here. For an up to date list search for HyperSpy in a scientific database e.g. Google Scholar.
Warning
The articles published before 2012 may mention the HyperSpy project under its old name, EELSLab