hyperspy.misc.eels.electron_inelastic_mean_free_path module

hyperspy.misc.eels.electron_inelastic_mean_free_path.iMFP_Iakoubovskii(density, electron_energy)

Estimate electron inelastic mean free path from density

Parameters

  • density (float) – Material density in g/cm**3

  • beam_energy (float) – Electron beam energy in keV

Notes

For details see Equation 9 in reference *.

*

Iakoubovskii, K., K. Mitsuishi, Y. Nakayama, and K. Furuya. ‘Thickness Measurements with Electron Energy Loss Spectroscopy’. Microscopy Research and Technique 71, no. 8 (2008): 626–31. https://doi.org/10.1002/jemt.20597

Returns

Inelastic mean free path in nanometers

Return type

float

hyperspy.misc.eels.electron_inelastic_mean_free_path.iMFP_TPP2M(electron_energy, density, M, N_v, E_g)

Electron inelastic mean free path using TPP-2M

Parameters

  • electron_energy (float) – Electron beam energy in keV

  • density (float) – Material density in g/cm**3

  • M (float) – Molar mass in g / mol

  • N_v (int) – Number of valence electron

  • E_g (float) – Band gap in eV

Returns

Inelastic mean free path in nanometers

Return type

float

Notes

For details see reference †.

†

Shinotsuka, H., S. Tanuma, C. J. Powell, and D. R. Penn. ‘Calculations of Electron Inelastic Mean Free Paths. X. Data for 41 Elemental Solids over the 50 EV to 200 KeV Range with the Relativistic Full Penn Algorithm: Calculations of Electron Inelastic Mean Free Paths. X’. Surface and Interface Analysis 47, no. 9 (September 2015): 871–88. https://doi.org/10.1002/sia.5789

hyperspy.misc.eels.electron_inelastic_mean_free_path.iMFP_angular_correction(density, beam_energy, alpha, beta)

Estimate the effect of limited collection angle on EELS mean free path

Parameters

  • density (float) – Material density in g/cm**3

  • beam_energy (float) – Electron beam energy in keV

  • alpha (float) – Convergence and collection angles in mrad.

  • beta (float) – Convergence and collection angles in mrad.

Notes

For details see Equation 9 in reference ‡.

‡

Iakoubovskii, K., K. Mitsuishi, Y. Nakayama, and K. Furuya. ‘Thickness Measurements with Electron Energy Loss Spectroscopy’. Microscopy Research and Technique 71, no. 8 (2008): 626–31. https://doi.org/10.1002/jemt.20597